Industrial & Military standard SSD

NFA100 is an extremely powerful and flexible NAND Flash testing platform, clients can test  NAND Flash parameters by using NFA100 system commands and even reprocess these parameters for eventual product development. Clients also can realize their specific testing requirements through API or usage of script commands. Specification: Supports 3D NAND with newest  process, 1x nm and 25nm, 34nm,  56nm Nand. Supports SLC，MLC，TLC，eMLC. Supports 8-bit and 16-bit  Asynchronous Nand. Supports Aynchronous, Toggle Flash. Supports regular NAND from Micron, Toshiba, Samsung, Intel, Sandisk and  Hynix. Supports Nand with TSOP48, BGA63,  BGA100, BGA132, BGA152  packagage. Custom and develop unconventional  and self-defined packaged Nand. Test customer’s self-developed BCH ECC or LDPC  intensity. Test Read Retry. Test NAND Flash at varying voltage. Test of physical destroy over NAND Flash ... To learn more, please refer to NFA100 manual ...

If all Page performance is basically the same when programming every time, this Nand Flash chip should be the most stable and reliable. Therefore, you can know the reliability of Nand Flash by observing the distribution of each Page performance. Although the datasheet for each Nand Flash chip will indicate detailed time of Erase, Program, and Read Performance , in fact, these Performances average the Lower page and the Upper Page, so it will mislead people that the performance of each page is the same, actually it is not. Renice test setting and idea: Take a new 3D Nand Flash for example, choose 1024 (03FF) Block, Program/Erase for 1000 times. The more stable the graph shows, the more reliable the Nand Flash is, if the graph floats drastically, the worse stability of the Nand flash. It looks stable when Page0 program A not ideal Lower Page test result as following. A not ideal Upper Page test result as following. Conclusion: the...

If you want to look for a Nand Flash test equipment, Renice have 3 types of Nand Flash Tester for your option, NFA100-E, NFA100 and NFA1000. What can Nand Flash Testers do? How to select a suitable Nand Flash Tester? Let us show more information, you might find the answer here. Brief Introduction NAF100-E , is an extremely powerful and flexible NAND Flash testing platform specially developed for R&D personnel whereby they can extract NAND Flash parameters in a maximal way by using NFA100-E system commands and even reprocess these parameters for eventual product development. User can also realize their specific testing requirements through API or usage of script commands. NAF100 and NAF1000 , is able to test up to 112pcs/1120pcs of NAND Flash at the same time. Besides all functions that NFA100-E has, NFA100 is equipped with high-low temperature chamber so that users are able to make high-low temp. cycle test, humidity and thermal shock test.NFA100 is also ...

With the widely promotion of 3D NAND Flash in the market, LDPC has became a key marketing advertisement by all flash vendors.     From the point of ECC, there is indeed no more powerful error correction algorithm than LDPC. But on the contrary, there also exists disagreements. Although the LDPC has been used by HDD for years, it is still unverified by the market when used in NAND Flash. In theory, LDPC is also with own defects. 1.        The latency time of LDPC is extremely long due to the process of iteration. 2.       The Soft Information is necessary. It’s easy to get the Soft Information of HDD at once, but it’s difficult to get the accurate Soft Information of NAND Flash. Once you get the wrong information, the result could be disastrous. Because the LDPC need to calculate the probability with the Soft Information, if the decoder of LDPC gets the wrong Soft Information, it will lead the wrong inform...

NFA100 is able to test up to 128PCs of NAND Flash at the same time. Besides all functions that NFA100-E has, NFA100 is equipped with high-low temperature chamber so that users are able to make high-low temp. cycle test, humidity and thermal shock test. NFA100 is also equipped with mechanical arm for automated loading or unloading of NAND Flash. It can repack the memory chips after performing the necessary tests, which avoids affection caused by manual work or ESD. NFA100 supports automated save of all test results, which can be remotedly tracked and reviewed. With NFA100 users are able to grade NAND Flashes according to various demand on reliability. For remote Demo or stechnical manual please contact may@renice-tech.com.

NFA100 способен тестировать до 128pcs в NAND Flash в то же время. Помимо всех функций, которые NFA100-E имеет, NFA100 оснащен высокой низкотемпературной камеры, так что пользователи могут делать высококачественные низкий темп. цикл испытаний, влажность и испытание теплового шока. NFA100 также оснащен манипулятором для автоматической загрузки или выгрузки NAND Flash. Он может переупакуем микросхемы памяти после выполнения необходимых тестов, что позволяет избежать привязанности, вызванные ручной работы или ОУР. NFA100 поддерживает автоматическую сохранения всех результатов испытаний, которые могут быть remotedly сопровождаемых и рассмотрены. С NFA100 пользователи могут класса NAND Flashes по разным спросом на надежности. Для удаленного Demo или stechnical руководства, пожалуйста, свяжитесь с may@renice-tech.com.

NAND Flash тестер (NFA100-E) разработана для контроллера флэш-памяти разработки инженеров, профессоров, мастеров или врачей, которые занимаются исследованием NAND Flash и персонала от конкретных учреждений, выполняющих исследования по надежности флэш-памяти. Поддержка NAND Flash 1. Поддержка 3D-памяти NAND с новейшим процессом, 1xnm, 25 нм, 34 нм и 56nm NAND 2. Поддержка SLC, MLC, TLC и eMLC Тип памяти NAND 3. Поддержка 8-битных и 16-битный асинхронный NAND 4. Поддержка Синхронное, Toggle NAND 5. Поддержка регулярных NAND от Micron, Toshiba, Samsung, Intel, Sandisk, Hynix 6. Поддержка памяти NAND с TSOP48, BGA63, BGA100, BGA132 и пакет BGA152 7. Индивидуальные разъем для памяти NAND с нетрадиционным пакетом Спец. Назначение 1. Проверьте способность МПБ ECC или LDPC собственной разработки 2. Тест чтения Retry 3. Тест NAND Flash при напряжении переменного 4. Проверка физического уничтожения над NAND Flash техническое описание продукта и ценообразование: may@renice-tech...