NAND Flash Tester, NFA100-E, NFA100, NFA1000


If you want to look for a Nand Flash test equipment, Renice have 3 types of Nand Flash Tester for your option, NFA100-E, NFA100 and NFA1000.



What can Nand Flash Testers do? How to select a suitable Nand Flash Tester? Let us show more information, you might find the answer here.

Brief Introduction

NAF100-E, is an extremely powerful and flexible NAND Flash testing platform specially developed for R&D personnel whereby they can extract NAND Flash parameters in a maximal way by using NFA100-E system commands and even reprocess these parameters for eventual product development. User can also realize their specific testing requirements through API or usage of script commands.


NAF100 and NAF1000, is able to test up to 112pcs/1120pcs of NAND Flash at the same time. Besides all functions that NFA100-E has, NFA100 is equipped with high-low temperature chamber so that users are able to make high-low temp. cycle test, humidity and thermal shock test.NFA100 is also equipped with mechanical arm for automated loading or unloading of NAND Flash. It can repack the memory chips after performing the necessary tests, which avoids affection caused by manual work or ESD.NFA100 supports automated save of all test results, which can be remotely tracked and reviewed. With NFA100 users are able to grade NAND Flashes according to various demand on reliability.

Quickly and efficiently sorting the NAND flash and classify the same batch of NAND flash according to the setting rules.

It is also able to select the NAND flash which would be suitable for the controller IC according to the controller’s specific ECC capability, which can improve the yield rate more than 99%. For SSD or eMMC solution providers, they can make good usage of the cheapest NAND flash, greatly increase profits.

The testers have the same method as the factory bad block management for bad block management of the NAND flash, the managed AND flash can be used with any controller IC.
NAF100 and NAF1000 can be equipped with fully automated mechanical operation. Capacity ≤2Tb, the longest test time is 2 hours, and one tester can test 8-12 rounds every day.

NAF1000 can test 960pcs (TSOP package) and 1120pcs (BGA package) NAND flash at the same time. Several testers can operate at the same time to build a low-cost, high-efficiency scale test factory.


Specification (NFA100-E, NFA100 and NFA1000)

•     Supports 3D NAND with newest process, 1x nm and 25nm, 34nm, 56nm Nand.
•     Supports SLC, MLC, TLC, eMLC.
•     Supports 8-bit and 16-bit AsynchronousNAND.
•     Supports Aynchronous, Toggle Flash.
•     Supports regular NAND from Micron, Toshiba, Samsung, Intel, Sandisk and Hynix.
•     Supports NAND with TSOP48, BGA63, BGA100, BGA132, BGA152 packagage.
•     Custom and develop unconventional and self-defined packaged NAND
•     Test customer's self-developed BCH ECC or LDPC intensity.
•     Test Read Retry.
•     Test NAND Flash at varying voltage.
•     Test of physical destroy over NAND Flash.

Hardware Structure Introduction (NFA1000)



• Main board and BGA/TOSP board
• All NAND flash are put into the High-Low temperature chamber.
• The test host is outside the High-Low temperature chamber.
• Equipped with mechanical arm for automated loading or unloading of NAND flash.


Test Result Display

Colors "Red, Blue, Green and Yellow" shows different result.
For fully automated tester, the tester will be automatically classified according to different colors.


Test Script automatically generated



The clients needs to fill in the corresponding parameters of the NAND flash when subscribing to
the tests.
The system automatically generates test scripts.
If need to do special tests, clients can custom the test script.



Software of test Script



Depth analysis Functions as following:

Supports Threshold Voltage Distribution tests



Supports 4 types of ECC capacity tests

Supports various Pattern & Custom

• Embedded with multiple mainstream test patterns.
• Custom patterns according to tests requirement.
• Support pattern's bit Flip test.


Supports tests to any Page



Supports All manufacturer's NAND Flash




Supports Factory Bad Block Management


Supports sending any command to any address



Supports Page and Block real performance assessment





Supports error distribution analysis


Supports Statistic Analysis of bit error


Supports Program Disturb Test



Supports Read Retry Test


Supports RBER & UBER Analyze

• Accurately evaluate RBER.
• Accurately evaluate UBER under 4 types of ECC test conditions.
• Accurately evaluate UBER and RBER underdifferent P/E cycle.
• Output and analyze the evaluation result.


Supports operation to P/E cycle in the setting pattern



Supports Script and API

• NFA100 provides Script, allowing clients more flexibly to custom test modes.
• Supports API, allow clients to custom tests interface.


If you want to know more information related to the NAND flash tester, please do not hesitate to contact me at may@renice-tech.com.

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