Industrial & Military standard SSD

NFA100 is an extremely powerful and flexible NAND Flash testing platform, clients can test  NAND Flash parameters by using NFA100 system commands and even reprocess these parameters for eventual product development. Clients also can realize their specific testing requirements through API or usage of script commands. Specification: Supports 3D NAND with newest  process, 1x nm and 25nm, 34nm,  56nm Nand. Supports SLC，MLC，TLC，eMLC. Supports 8-bit and 16-bit  Asynchronous Nand. Supports Aynchronous, Toggle Flash. Supports regular NAND from Micron, Toshiba, Samsung, Intel, Sandisk and  Hynix. Supports Nand with TSOP48, BGA63,  BGA100, BGA132, BGA152  packagage. Custom and develop unconventional  and self-defined packaged Nand. Test customer’s self-developed BCH ECC or LDPC  intensity. Test Read Retry. Test NAND Flash at varying voltage. Test of physical destroy over NAND Flash ... To learn more, please refer to NFA100 manual ...

Firstly, let’s see the conclusion that Renice draw based on the test from Nand Flash test platform NFA100. 1, the P/E cycle of some Block up to 20,000 times in real test, though it said only 3,000 times in datasheet. 2, Each block is an independent individual, and the initial condition of each block is not exactly the same, even though they are the same process in the same production line. 3, No matter it’s original Nand Flash or non-original, they have the necessity of testing, the Nand Flash can be sorted and classified into different levels. 4, Though it is the same Nand Flash chip, the health condition of each Block is not the same 5, The real lifetime (P/E cycle) of Nand Flash may be far greater than its datasheet, only when test, it can play the greater value. 6, Deep understanding of the life performance of Nand Flash in different P/E stages can help better plan ECC. 7, For those who want to convert MLC mode to SLC at a certain stage, when to start ...

If all Page performance is basically the same when programming every time, this Nand Flash chip should be the most stable and reliable. Therefore, you can know the reliability of Nand Flash by observing the distribution of each Page performance. Although the datasheet for each Nand Flash chip will indicate detailed time of Erase, Program, and Read Performance , in fact, these Performances average the Lower page and the Upper Page, so it will mislead people that the performance of each page is the same, actually it is not. Renice test setting and idea: Take a new 3D Nand Flash for example, choose 1024 (03FF) Block, Program/Erase for 1000 times. The more stable the graph shows, the more reliable the Nand Flash is, if the graph floats drastically, the worse stability of the Nand flash. It looks stable when Page0 program A not ideal Lower Page test result as following. A not ideal Upper Page test result as following. Conclusion: the...

If you want to look for a Nand Flash test equipment, Renice have 3 types of Nand Flash Tester for your option, NFA100-E, NFA100 and NFA1000. What can Nand Flash Testers do? How to select a suitable Nand Flash Tester? Let us show more information, you might find the answer here. Brief Introduction NAF100-E , is an extremely powerful and flexible NAND Flash testing platform specially developed for R&D personnel whereby they can extract NAND Flash parameters in a maximal way by using NFA100-E system commands and even reprocess these parameters for eventual product development. User can also realize their specific testing requirements through API or usage of script commands. NAF100 and NAF1000 , is able to test up to 112pcs/1120pcs of NAND Flash at the same time. Besides all functions that NFA100-E has, NFA100 is equipped with high-low temperature chamber so that users are able to make high-low temp. cycle test, humidity and thermal shock test.NFA100 is also ...

NFA100 is able to test up to 128PCs of NAND Flash at the same time. Besides all functions that NFA100-E has, NFA100 is equipped with high-low temperature chamber so that users are able to make high-low temp. cycle test, humidity and thermal shock test. NFA100 is also equipped with mechanical arm for automated loading or unloading of NAND Flash. It can repack the memory chips after performing the necessary tests, which avoids affection caused by manual work or ESD. NFA100 supports automated save of all test results, which can be remotedly tracked and reviewed. With NFA100 users are able to grade NAND Flashes according to various demand on reliability. For remote Demo or stechnical manual please contact may@renice-tech.com.