NFA100 NAND flash Test System (tester)

NFA100 is able to test up to 128PCs of NAND Flash at the same time. Besides all functions that NFA100-E has, NFA100 is equipped with high-low temperature chamber so that users are able to make high-low temp. cycle test, humidity and thermal shock test.

NFA100 is also equipped with mechanical arm for automated loading or unloading of NAND Flash. It can repack the memory chips after performing the necessary tests, which avoids affection caused by manual work or ESD.

NFA100 supports automated save of all test results, which can be remotedly tracked and reviewed. With NFA100 users are able to grade NAND Flashes according to various demand on reliability.

For remote Demo or stechnical manual please contact may@renice-tech.com.




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