Industrial & Military standard SSD

In ITS (Intelligent Transportation Systems), PIS (Passenger Information System) and other embedded in-vehicle application, such as video surveillance, data recorder…usually or sometimes the voltage changes unstably, SSD as embedded memory and storage device when doing data video recording is aggressively affected by the unstable input voltage. First of all, please let me introduce RBER (Raw-Bit Error Rate), RBER is the Bit Error Rate before ECC (Error Correction Code) performing, reflects the initial reliability of Nand flash. The higher RBER, the less reliability of Nand flash. Then, how Input Voltage Affects the Nand Flash of SSD? Firstly, per 0.3V as a voltage difference in set time, the below graph is 3.3V-3.6V fluctuation. (1) When setting 2.7V - 3.V (standard voltage range of NAND flash), the RBER of NAND flash is 10^(-5.850), which is in normal range. (2) When setting as 3.6V - 3.9V, the RBER begins to increase, reach at 10^(-5.845). (3) When Voltage ran...

NFA100 is able to test up to 128PCs of NAND Flash at the same time. Besides all functions that NFA100-E has, NFA100 is equipped with high-low temperature chamber so that users are able to make high-low temp. cycle test, humidity and thermal shock test. NFA100 is also equipped with mechanical arm for automated loading or unloading of NAND Flash. It can repack the memory chips after performing the necessary tests, which avoids affection caused by manual work or ESD. NFA100 supports automated save of all test results, which can be remotedly tracked and reviewed. With NFA100 users are able to grade NAND Flashes according to various demand on reliability. For remote Demo or stechnical manual please contact may@renice-tech.com.

NFA100 способен тестировать до 128pcs в NAND Flash в то же время. Помимо всех функций, которые NFA100-E имеет, NFA100 оснащен высокой низкотемпературной камеры, так что пользователи могут делать высококачественные низкий темп. цикл испытаний, влажность и испытание теплового шока. NFA100 также оснащен манипулятором для автоматической загрузки или выгрузки NAND Flash. Он может переупакуем микросхемы памяти после выполнения необходимых тестов, что позволяет избежать привязанности, вызванные ручной работы или ОУР. NFA100 поддерживает автоматическую сохранения всех результатов испытаний, которые могут быть remotedly сопровождаемых и рассмотрены. С NFA100 пользователи могут класса NAND Flashes по разным спросом на надежности. Для удаленного Demo или stechnical руководства, пожалуйста, свяжитесь с may@renice-tech.com.