Industrial & Military standard SSD

NFA100 is an extremely powerful and flexible NAND Flash testing platform, clients can test  NAND Flash parameters by using NFA100 system commands and even reprocess these parameters for eventual product development. Clients also can realize their specific testing requirements through API or usage of script commands. Specification: Supports 3D NAND with newest  process, 1x nm and 25nm, 34nm,  56nm Nand. Supports SLC，MLC，TLC，eMLC. Supports 8-bit and 16-bit  Asynchronous Nand. Supports Aynchronous, Toggle Flash. Supports regular NAND from Micron, Toshiba, Samsung, Intel, Sandisk and  Hynix. Supports Nand with TSOP48, BGA63,  BGA100, BGA132, BGA152  packagage. Custom and develop unconventional  and self-defined packaged Nand. Test customer’s self-developed BCH ECC or LDPC  intensity. Test Read Retry. Test NAND Flash at varying voltage. Test of physical destroy over NAND Flash ... To learn more, please refer to NFA100 manual ...

In ITS (Intelligent Transportation Systems), PIS (Passenger Information System) and other embedded in-vehicle application, such as video surveillance, data recorder…usually or sometimes the voltage changes unstably, SSD as embedded memory and storage device when doing data video recording is aggressively affected by the unstable input voltage.   First of all, please let me introduce RBER (Raw-Bit Error Rate), RBER is the Bit Error Rate before ECC (Error Correction Code) performing, reflects the initial reliability of Nand flash. The higher RBER, the less reliability of Nand flash. Then, how Input Voltage Affects the Nand Flash of SSD? Firstly, per 0.3V as a voltage difference in set time, the below graph is 3.3V-3.6V fluctuation. (1) When setting 2.7V - 3.V (standard voltage range of NAND flash), the RBER of NAND flash is 10^(-5.850), which is in normal range. (2) When setting as 3.6V - 3.9V, the RBER begins to increase, reach at 10^(-5.845). (...